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【序号】：1
【作者】：<SPAN class=popupWeb style="CURSOR: pointer; POSITION: relative" authinfo="

  Affiliation Information  
1. University of Twente,MESA+ Institute for Nanotechnology and Faculty of Science and Technology,Department of Materials Science and Technology of Polymers, P.O. Box 217, Enschede, The Netherlands

">Davide Tranchida , <SPAN class=popupWeb style="CURSOR: pointer; POSITION: relative" authinfo="

  Affiliation Information  
1. University of Twente,MESA+ Institute for Nanotechnology and Faculty of Science and Technology,Department of Materials Science and Technology of Polymers, P.O. Box 217, Enschede, The Netherlands

"> Jordi Diaz , <SPAN class=popupWeb style="CURSOR: pointer; POSITION: relative" authinfo="

  Affiliation Information  
1. University of Twente,MESA+ Institute for Nanotechnology and Faculty of Science and Technology,Department of Materials Science and Technology of Polymers, P.O. Box 217, Enschede, The Netherlands

"> Peter Schön , <SPAN class=popupWeb style="CURSOR: pointer; POSITION: relative" authinfo="

  Affiliation Information  
1. University of Twente,MESA+ Institute for Nanotechnology and Faculty of Science and Technology,Department of Materials Science and Technology of Polymers, P.O. Box 217, Enschede, The Netherlands

"> Holger Schönherr and <SPAN class=popupWeb style="CURSOR: pointer; POSITION: relative" authinfo="

  Affiliation Information  
1. University of Twente,MESA+ Institute for Nanotechnology and Faculty of Science and Technology,Department of Materials Science and Technology of Polymers, P.O. Box 217, Enschede, The Netherlands

">G. Julius Vancso
【题名】：Scanning Near-Field Ellipsometry Microscopy: imaging nanomaterials with resolution below the diffraction limit
【期刊】：Nanoscale,
【年、卷、期、起止页码】：2011,3, 233-239
【链接】：http://pubs.rsc.org/en/Content/ArticleLanding/2011/NR/C0NR00530D