【序号】:1
【作者】:M Takeda and Z Tung
【题名】:Subfringe holographic interferometry by computer-based spatial-carrier fringe-pattern analysis
【期刊】:
Journal of Optics【年、卷、期、起止页码】: 1985
J. Opt. 16 127
Volume 16, Number 3【全文链接】:http://iopscience.iop.org/0150-536X/16/3/004
【序号】:2
【作者】:<a href="" Z')" >Zongtao Ge and <a href="" M')" >Mitsuo Takeda
【题名】High-Resolution Two-Dimensional Angle Measurement Technique Based on Fringe Analysis:
【期刊】: Applied Optics,
【年、卷、期、起止页码】: Vol. 42, Issue 34, pp. 6859-6868 (2003)
【全文链接】:http://www.opticsinfobase.org/abstract.cfm?URI=AO-42-34-6859
【序号】:3
【作者】:
Mitsuo Takeda【题名】:Spatial-carrier fringe-pattern analysis and its applications to precision interferometry and profilometry: An overview
【期刊】:
ndustrial Metrology[td]
【年、卷、期、起止页码】: Volume 1, Issue 2 [/td]
【全文链接】:http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B7P71-4F7XV18-1&_user=2324792&_coverDate=06%2F30%2F1990&_rdoc=1&_fmt=high&_orig=search&_sort=d&_docanchor=&view=c&_searchStrId=1390954368&_rerunOrigin=scholar.google&_acct=C000056916&_version=1&_urlVersion=0&_userid=2324792&md5=930fb944a91f2a239f2bf089ed4e87e5