【序号】：1 【作者】：Liu, Y. Huang, C.Y. Shan, N.N. Lu, C.Z. Gao, G.B. 【题名】：Failure analysis of VDMOS in DC/DC converter 【年、卷、期、起止页码】：PFA 2009. 16th IEEE International Symposium on the Issue Date : 6-10 July 2009 On page(s): 388 - 392 【全文链接】：http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5232626
【序号】：2 【作者】：U-Yaisom, C. Khanngern, W. Nitta, S. 【题名】：The study and analysis of the conducted EMI suppression on power MOSFET using passive snubber circuits 【年、卷、期、起止页码】：Electromagnetic Compatibility, 2002 3rd International Symposium on Issue Date : 21-24 May 2002 On page(s): 561 - 564 【全文链接】：hhttp://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1177495
【序号】：3 【作者】：Patel, H.K.; 【题名】：Voltage transient spikes suppression in flyback converter using dissipative voltage snubbers 【年、卷、期、起止页码】：ICIEA 2008. 3rd IEEE Conference on Issue Date: 3-5 June 2008 On page(s): 897 - 901 【全文链接】：http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=4582645
【序号】：4 【作者】：Won-suk Choi Sung-mo Young 【题名】：Effectiveness of fast recovery MOSFETs to reliability of switching power supplies 【年、卷、期、起止页码】：SPEEDAM), 2010 International Symposium on Issue Date : 14-16 June 2010 On page(s): 1113 - 1118 【全文链接】：http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5542026
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