【序号】:1
【作者】:Frederix, P.L.T.M.; Bosshart, P.D.; Engel, A.; Akiyama, T.; De Rooij, N.F.; Staufer, U;
【题名】:Comparison of two redox couples for AFM-SECM
【期刊】:Sensors, 2007 IEEE
【年、卷、期、起止页码】: 2007 , Page(s): 703 - 706
【全文链接】:http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4388496
【序号】:2【作者】:Burt, D.P.; Dobson, P.S.; Weaver, J.M.R.; Wilson, N.R.; Unwin, P.R.; Macpherson, J.V.;
【题名】:Developments in Nanowire Scanning Electrochemical - Atomic Force Microscopy (SECM-AFM) Probes
【期刊】:Sensors, 2007 IEEE
【年、卷、期、起止页码】: 2007 , Page(s): 712 - 715
【全文链接】:http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4388499【序号】:3
【作者】:Patrick L T M Frederix1,4, Patrick D Bosshart1, Terunobu Akiyama2, Mohamed Chami1, Maurizio R Gullo2,5, Jason J Blackstock3,6, Karin Dooleweerdt1,7, Nico F de Rooij2, Urs Staufer2,8 and Andreas Engel1,4;
【题名】:
Conductive supports for combined AFM–SECM on biological membranes
【期刊】:
Nanotechnology
【年、卷、期、起止页码】:
2008 Volume 19, Number 38【全文链接】:http://iopscience.iop.org/0957-4484/19/38/384004/pdf/0957-4484_19_38_384004.pdf【序号】:4
【作者】:Ye Tao, Rainer J. Fasching, Fritz B. Prinz
【题名】:Ultrasharp high-aspect-ratio probe array for SECM and AFM Analysis
【期刊】:Smart Structures and Materials 2004
【年、卷、期、起止页码】: pp.431-442
【全文链接】:http://spie.org/x648.html?product_id=547655【序号】:5
【作者】:Rainer J. Fasching, Yao Tao, Fritz B. Prinz
【题名】:
Fabrication of an electrochemical tip-probe system embedded in SiNx cantilevers for simultaneous SECM and AFM analysis
【期刊】:
Micromachining and Microfabrication Process Technology IX
【年、卷、期、起止页码】:
2003 Vol. 5342 pp.53-64
【全文链接】:http://spie.org/x648.html?product_id=524452