主题：【已应助】求助ScienceDirect文献5篇，多谢……

【序号】：1
【作者】：M.F. Guimona, G. Pfister-Guillouzo, a, , M. Bremontb, W. Brockmannb, C.

Quetc, J.Y. Chenardc
【题名】：Application of X-ray photoelectron spectroscopy to the study of degradation

mechanisms of epoxy-bonded joints of zinc coated steel
【期刊】：Applied Surface Science
【年、卷、期、起止页码】：Volume 108, Issue 1, January 1997, Pages 149–157
【全文链接】：http://www.sciencedirect.com/science/article/pii/S0169433296005788

【序号】：2
【作者】：S. Bandyopadhyaya, G.K. Paula, R. Roya, S.K. Sena, , , S. Senb
【题名】：Study of structural and electrical properties of grain-boundary modified ZnO

films prepared by sol–gel technique
【期刊】：Materials Chemistry and Physics
【年、卷、期、起止页码】：Volume 74, Issue 1, 1 February 2002, Pages 83–91
【全文链接】：http://www.sciencedirect.com/science/article/pii/S0254058401004023

【序号】：3
【作者】：E.A. Dalchielea, , , P. Giorgia, R.E. Marottia, F. Martı́nb, J.R. Ramos-

Barradob, R. Ayoucib, D. Leinenb
【题名】：Electrodeposition of ZnO thin films on n-Si(1 0 0)
【期刊】：Solar Energy Materials and Solar Cells
【年、卷、期、起止页码】：Volume 70, Issue 3, 31 December 2001, Pages 245–254
【全文链接】：http://www.sciencedirect.com/science/article/pii/S0927024801000654

【序号】：4
【作者】：K.G. Sawa, , , K. Ibrahimb, Y.T. Lima, M.K. Chaib
【题名】：Self-compensation in ZnO thin films: An insight from X-ray photoelectron

spectroscopy, Raman spectroscopy and time-of-flight secondary ion mass spectroscopy

analyses
【期刊】：Thin Solid Films
【年、卷、期、起止页码】：Volume 515, Issue 5, 22 January 2007, Pages 2879–2884
【全文链接】：http://www.sciencedirect.com/science/article/pii/S0040609006010522

【序号】：5
【作者】：C.A. Leighton, A.J. Swift, J.C. Vickerman
【题名】：Further characterisation of Pd deposited on an extensively oxidised Zn(001)

support
【期刊】：Surface Science
【年、卷、期、起止页码】：Volume 253, Issues 1–3, 1 August 1991, Pages 220–232
【全文链接】：http://www.sciencedirect.com/science/article/pii/003960289190594I