【序号】:1
【作者】:
M. Zier 【题名】:
Interface formation and reactions at Ta-Si and Ta-SiO 2 interfaces studied by XPS and ARXPS【期刊】:
Journal of Electron Spectroscopy and Related Phenomena 【年、卷、期、起止页码】:
2004,
137-140,
229-233【全文链接】:https://www.infona.pl/resource/bwmeta1.element.elsevier-c410ed44-858f-3e9c-9bc4-99b7df991329
谢谢!