原文由 willcon 发表:
You can get the RIR value from the PDF cards or doing tests by yourself. And then you can compare the differrent phase's characteristc peak's intensity and get their wt% in the samples from a foemula (you can get it from any books on X-ray diffraction).
Do you mean RIRs(=relative intensity ratio???) of two different cards can be compared ? Or, we can prepare the standard samples with various relative compositions. Then we measure the samples by XRD. By comparing the relative intensities of the main peaks of the two phases, the phase content can obtain from the standard line.