该综述是我今年刚发表的,希望对作AFM高分辨工作的同仁有所帮助,也欢迎讨论!
论文题目:Atomic and Subnanometer Resolution in Ambient Conditions by Atomic Force Microscopy
作者:Yang Gan(甘阳)
作者单位:哈尔滨工业大学
期刊:Surface Science Reports
年/卷期/页:2009, vol. 64, 99-121
DOI:http://dx.doi.org/10.1016/j.surfrep.2008.12.001
全文:请见附件
内容介绍:该综述就应用原子力显微镜(AFM)在常温常压下进行表面的原子、亚纳米分辨成像的理论和实验基础进行了详细介绍,并对已发表的相关研究成果作了全面深入的总结和分析,引用相关参考文献220篇。综述全文由10个部分组成:前言,AFM的原理和工作模式,AFM的分辨率,针尖-表面作用力,实现原子、亚纳米分辨成像的条件,假相和重现性,常温常压下原子分辨结果一览和分析,AFM晶格分辨成像-如何获得有用信息,生物样品的表面亚纳米分辨成像概述,展望。
摘要:This article reviews the achievements of both atomic resolution and subnanometer (molecular) resolution in ambient conditions by atomic force microscopy (AFM). The principles of AFM and AFM operation modes are first introduced. The concept of resolution is then discussed. Various types of tipsurface forces, particularly the forces prominent in liquid and in air, are introduced. Different viewpoints on the conditions for achieving atomic/subnanometer resolution are reviewed. The important issues of reproducibility and artifacts are discussed in depth, with many examples from the literature. The central portion of this article is a critical review of the published results of atomic resolution, dating from 1993 up to 2007. The achievements of subnanometer resolution on biological samples are then briefly overviewed. Examples are given to demonstrate how to obtain reliable structural information from lattice resolution or pseudo-atomic resolution topographs. Finally, the challenges of AFM as a trustworthy high resolution technique are discussed.
Gan-Surf Sci Rep-2009-Atomic and subnanometer resolution in ambient conditions by atomic force microscopy_(small size file)