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原文由 alpha544 发表:
A new type of scanning electron microscope with aberration correction allows a resolution of 0.1 nm. The instrument also allows for simultaneous imaging of atoms on the surface and in the bulk of a sample, which represents a real breakthrough in the field.
Nature Materials 8, 808 - 812 (2009)
Published online: 20 September 2009 | doi:10.1038/nmat2532
原文由 alpha544 发表:
A new type of scanning electron microscope with aberration correction allows a resolution of 0.1 nm. The instrument also allows for simultaneous imaging of atoms on the surface and in the bulk of a sample, which represents a real breakthrough in the field.
Nature Materials 8, 808 - 812 (2009)
Published online: 20 September 2009 | doi:10.1038/nmat2532
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