【序号】:1 【作者】:T. Reich1 and V. I. Nefedov 【题名】:Quantitative XPS surface analysis: Correction for contamination layer 【期刊】: Journal of Electron Spectroscopy and Related Phenomena 【年、卷、期、起止页码】:Volume 56, Issue 1, February 1991, Pages 33-49 【全文链接】: http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TGC-44J177X-P&_user=10&_rdoc=1&_fmt=&_orig=search&_sort=d&_docanchor=&view=c&_searchStrId=1164174135&_rerunOrigin=scholar.google&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&md5=e3036711694af71d47f3c4f6264b998a