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【序号】： 1
【作者】： K. Kajiwara
【题名】： Crystalline effects on depth resolution in AES depth profiling
【期刊】： Surface and Interface Analysis, Volume 22, Issues 1-12, Pages 22-26 (July 1994)
【全文链接】：http://onlinelibrary.wiley.com/doi/10.1002/sia.740220108/pdf

【序号】： 2
【作者】：
【题名】： American society for testing and materials. Standard practice for determination of the specimen area contributing to the detected in X-ray photoelectron spectroscopy and Auger electron spectroscopy (E1217-87)
【期刊】： Surface and Interface Analysis, Volume 17, Issue 6, Pages 391-396 (June 1991)
【全文链接】：http://onlinelibrary.wiley.com/doi/10.1002/sia.740170615/pdf

【序号】： 3
【作者】： P. De Volder, R. Hoogewijs, R. De Gryse, L. Fiermans, J. Vennik
【题名】： Maximum likelihood common factor analysis in Auger electron spectroscopy
【期刊】： Surface and Interface Analysis, Volume 17, Issue 6, Pages 363-372 (June 1991)
【全文链接】：http://onlinelibrary.wiley.com/doi/10.1002/sia.740170612/pdf

【序号】： 4
【作者】： H. L. L. Watton, A. G. Fitzgerald, P. A. Moir
【题名】： Composition of thin surface layers obtained by X-ray photoelectron spectroscopy
【期刊】： Surface and Interface Analysis, Volume 17, Issue 6, Pages 320-324 (June 1991)
【全文链接】：http://onlinelibrary.wiley.com/doi/10.1002/sia.740170605/pdf

【序号】： 5
【作者】： S. Mischler, H. E. Bishop
【题名】： A novel practical approach to the quantification of Auger electron spectroscopy
【期刊】： Surface and Interface Analysis, Volume 17, Issue 6, Pages 315-319 (June 1991)
【全文链接】：http://onlinelibrary.wiley.com/doi/10.1002/sia.740170604/pdf