先谢谢了。
1、
【作者】:Chu Ryang Wie【题名】:High resolution x-ray diffraction characterization of semiconductor structures
【期刊、年、卷、期、起止页码】:Materials Science and Engineering: R: Reports Volume 13, Issue 1, 15 September 1994,Pages 1-56
【全文链接】:
http://dx.doi.org/10.1016/0927-796X(94)90008-6