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[序号]1
[
作者]P Moeck, et al
[
题名]High spatial resolution semi-automatic crystallite orientation and phase

mapping of nanocrystals in TEM
[
期刊]Crystal Research and Technology

[年、卷、期、起止页码]2011, 46(6) 589-606
[
全文链接]http://onlinelibrary.wiley.com/doi/10.1002/crat.201000676/abstract



[序号]2
[
作者]G Benner, et al
[
题名]Nano beam diffraction and precession in an energy fitered Cs corrected TEM
[
期刊]Crystal Research and Technology

[年、卷、期、起止页码]2011, 46(6) 580-588
[
全文链接]http://onlinelibrary.wiley.com/doi/10.1002/crat.201000582/abstract



[序号]3
[
作者]U Schurmann, et al
[
题名]Precession electron diffraction-a versatile tool for the characterization of

phase change materials
[
期刊]Crystal Research and Technology

[年、卷、期、起止页码]2011, 46(6) 561-568
[
全文链接]http://onlinelibrary.wiley.com/doi/10.1002/crat.201000516/abstract



[序号]4
[
作者]Zhiwu Chen et al
[
题名]Low temperature preparation of bismuth ferrite microcrystals by a sol-gel

method
[
期刊]Crystal Research and Technology

[年、卷、期、起止页码]2011, 46(3) 309-314
[
全文链接]http://onlinelibrary.wiley.com/doi/10.1002/crat.201000545/abstract



[序号]5
[
作者]J. D. Bucci, et al
[
题名]The precision determination of the lattice parameters and the coefficients of

thermal expansion of BiFeO3
[
期刊]Journal of Applied Crystallography

[年、卷、期、起止页码]1972, 5(3) 187-191
[
全文链接]http://onlinelibrary.wiley.com/doi/10.1107/S0021889872009173/abstract
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