【序号】:1
【作者】:Yasuhiro Mizutani and Tetsuo Iwata
【题名】:Thin Film Thickness Measurement by Surface Plasmon Resonance Using a Modified Otto’s Configuration Combined with Ellipsometry
【期刊】:International Journal of Automation Technology
【年、卷、期、起止页码】:2011,
Vol.5, No.2 ,pp. 236-240, 2011
【链接】:
http://www.fujipress.jp/finder/xslt.php?mode=present&inputfile=IJATE000500020027.xml