我在查阅文献时看到有的学者通过TEM和“ellipse-fitting method”来研究纳米颗粒的粒径分布。原文如下： Crystal outlines were digitized from scanned,low-magnification TEM photomicrographs and their dimensions estimated by calculating the best fit of an ellipse(of same surface) to the contours. The length (L) and width (W) of a crystal were then matched to the major and minor axes, respectively, of the best-fitting ellipse. The sizes are the averages of L and W; the shape factors,describing the elongation of the crystals, were chosen asthe ratio W/L. 大家见过这种分析方法吗？想和大家交流一下！谢谢
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