【序号】:1
【作者】:K. Suenaga, M. Tencé1, C. Mory, C. Colliex, H. Kato, T. Okazaki, H. Shinohara, K. Hirahara, S. Bandow, S. Iijima
【题名】:Element-Selective Single Atom Imaging
【期刊、年、卷、期、起止页码】:Science ,2000,Vol. 290 no. 5500 pp. 2280-2282
【全文链接】:http://www.sciencemag.org/content/290/5500/2280
【序号】:2
【作者】:Watanabe, M and Williams, DB
【题名】:Frontiers of X-ray Analysis in Analytical Electron Microscopy: Toward Atomic-Scale Resolution and Single-Atom Sensitivity
【期刊、年、卷、期、起止页码】:Microscopy and Microanalysis 12,515-526,2006
【全文链接】:
【序号】:3
【作者】:Parsons, JR, Johnson, HM, Hoelke, CW and Hosbons, RR
【题名】:Imaging of Uranium Atoms with the Electron Microscope by Phase Contrast
【期刊、年、卷、期、起止页码】:Phil. Mag. 29, 1359-1368,1973
【全文链接】:
【序号】:4
【作者】:Iijima,S
【题名】:Observation of single and clusters of atoms
【期刊、年、卷、期、起止页码】:Optik, vol 48, 193, 1977
【全文链接】: