主题：从Seeing at nanoscale 4看SPM未来发展方向

我比较关注session 1和2，以及5，要是有机会去学习学习该多好啊。你们关注哪一块呢？

http://www.veeco.com/support/nanoconference/about_session.php

Session Details
SESSION 1

Title:
Extending the Limits of SPM: High Speed Scanning, Ultra High Resolution Imaging, Multiple Probe SPM

Focus:
Methods to measure static and dynamic Nanoscale mechanical and tribological properties, including nanoindenting, scratching and NanoDMA.  The session will concentrate on molecular models and the understanding of fundamental properties in relation to the above measurement modes.

Chair:
Franz Giessibl, University of Regensburg, Germany

Invited Speaker:
Flemming Besenbacher, University of Aarhus, Denmark




SESSION 2

Title:
From Single Biomolecules To Cells: Using AFM and Combined AFM-Optical Techniques to Probe Biological Structures and Forces     

Focus:
Techniques to image cells, proteins, lipids, and tissue samples in physiologically relevant environments including high resolution imaging of static samples and visualization of dynamic events to measure inter- and intra-molecular forces.

Chair:
Dario Anselmetti, Bielefeld University, Germany


SESSION 3

Title:
Next Generation Materials and Polymer Systems

Focus:
Methods to image and manipulate, from single macromolecule and functional self-assemblies to complete materials systems.

Chair:
Sergei Magonov, Veeco Instruments, Santa Barbara

Invited Speaker:
Martin Moeller, German Wool Institute/Technical University of Aachen, Germany


SESSION 4

Title:
Beyond Topography:  Measurement of Physical Properties at the Nanoscale – Nanomechanical, Electrical, Optical, Magnetic & Thermal

Focus:
Material characterization in nanometer and sub-micron scale with emphasis on electrical, optical, magnetic and thermal properties

Chair:
Dawn Bonnell, University of Pennsylvania, USA

Invited Speaker:  Kumar Wickramasinghe, IBM Almaden Research Center, San Jose, USA

Invited Speaker: Zhongfan Liu, Peking University, Beijing, China

SESSION 5

Title:
Instruments and Probes – New Tools & Techniques for Nanoscience

Focus:
Innovative & future developments of SPM tools and techniques, probes and sensors

Chair:
Chang Liu, University of Illinois, Urbana-Champaign, USA

Invited Speaker:
Masamichi Fujihira,  Tokyo Institute of Technology, Japan