【序号】:
【作者】:Lei Yan et al
【题名】:Research status of dark current in CMOS image sensor
【期刊】:2021 Proceedings Volume 11763, 1176340
【全文链接】:https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11763/2586827/Research-status-of-dark-current-in-CMOS-image-sensor/10.1117/12.2586827.short?SSO=1