【序号】:1 【作者】:B. Viguier; K. J. Hemker; G. Vanderschaeve 【题名】:Factors affecting stacking fault contrast in transmission electron microscopy Comparisons with image simulations 【期刊】:Philosophical Magazine A 【年、卷、期】:Volume 69, Issue 1 January 1994 , pages 19 - 32 【全文链接】: http://www.informaworld.com/smpp/content~content=a757456171~db=all~order=page