主题：【资料】Applied Scanning Probe Methods VI

Applied Scanning Probe Methods VI

Applied Scanning Probe Methods VI

Title: Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology)
Author: Bharat Bhushan and Satoshi Kawata
Publisher: Springer
Publication Date: 2006-11-10
Number Of Pages: 338

Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology)

Summary:

The volumes V, VI and VII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Written for:
Professionals in industry dealing with surface analytics; scientists at universities in physical chemistry/physics, materials science, polymer science departments

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