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leo324324分享:fundamental parameter methods in XRF spectroscopy
fundamental parameter methods in XRF spectroscopy非常好的一本英文资料
ABSTRACT
It is shown that fundamental parameter based quantification is a versatile way of extracting analytical result from XRF measurements. For thick, bulk materials two software package are available which yield similar results. Only one of them is also capable of coping with stacks of layers of unknown thickness. Results for a number of sputtered layers are compared with ICP-AES data and the agreement is found excellent.