【序号】:1
【作者】:H. Bartko et al
【题名】:The fringe detection laser metrology for the GRAVITY interferometer at the VLTI
【期刊、年、卷、期、起止页码】:Proceedings Volume 7734, Optical and Infrared Interferometry II; 773421 (2010);
【全文链接】:
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7734/773421/The-fringe-detection-laser-metrology-for-the-GRAVITY-interferometer-at/10.1117/12.856698.short【序号】:2
【作者】:Chufan Jiang; Song Zhang
【题名】:Absolute phase unwrapping for dual-camera system without embedding statistical features
【期刊、年、卷、期、起止页码】:Proceedings Volume 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI; 1022009 (2017);
【全文链接】:
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10220/1022009/Absolute-phase-unwrapping-for-dual-camera-system-without-embedding-statistical/10.1117/12.2262564.short【序号】:3
【作者】:Peirong Jia et al
【题名】:Comparison of linear and non-linear calibration methods for phase-shifting surface-geometry measurement
【期刊、年、卷、期、起止页码】:Proceedings Volume 6051, Optomechatronic Machine Vision; 60510G (2005);
【全文链接】:
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/6051/60510G/Comparison-of-linear-and-non-linear-calibration-methods-for-phase/10.1117/12.649016.short【序号】:4
【作者】:Ruihua Zhang et al
【题名】:Rapid matching of stereo vision based on fringe projection profilometry
【期刊、年、卷、期、起止页码】:Proceedings Volume 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 96840K (2016);
【全文链接】:
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/9684/96840K/Rapid-matching-of-stereo-vision-based-on-fringe-projection-profilometry/10.1117/12.2243803.short【序号】:5
【作者】:Nikolaus Karpinsky et.al
【题名】:High-resolution, real-time fringe pattern profilometry
【期刊、年、卷、期、起止页码】:Proceedings Volume 7522, Fourth International Conference on Experimental Mechanics; 75220E (2010);
【全文链接】:
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7522/75220E/High-resolution-real-time-fringe-pattern-profilometry/10.1117/12.851484.short