Step0: Align STEM mode, get STEM image.
Step1: locate beam in STEM image onto desired point.
Step2: Acquire EELS with very short collection time (sub milliseconds) to observe ZLP.
Step3: calibrate ZLP position if necessary.
Step4: Shift Beam energy to desired core-loss position
Step5: View EELS in continuous mode and slowly increase exposure time. Observe core-loss edge.
Step6: acquire EELS with conditions defined in Step5.
原文由 mmctem 发表:
hehe,不好意思,没说清楚,我是想做谱分析,就像在一些文献里报道的那样,在获取高分辨z衬度像之后,在上面选系列点作eels分析,应该是在stem模式下吧。我用的是G2 F30,主要问题就是怎么在此模式下调整设置eels的相关参数。多谢高手指点。