【序号】:1
【作者】:Phillip S. Dobson, John M. R. Weaver, David P. Burt, Mark N. Holder, Neil R. Wilson, Patrick R. Unwin and Julie V. Macpherson
【题名】:Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces
【期刊】:Phys. Chem. Chem. Phys
【年、卷、期、起止页码】: 2006, 8, 3909-3914
【全文链接】:http://pubs.rsc.org/en/Content/ArticleLanding/2006/CP/b605828k
【序号】:2
【作者】:Moon, J. S., J. Wiedemair, et al.
【题名】:Atomic force scanning electrochemical microscopy (AFM-SECM) for electrochemical imaging at the nanoscale
【期刊】:Microscopy and Microanalysis
【年、卷、期、起止页码】: 2007, 13: 58-59
【全文链接】:http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=1212424&fulltextType=PI&fileId=S1431927607073734
【序号】:3
【作者】:Zhao, X. C., N. O. Petersen, et al.
【题名】:Comparison study of live cells by atomic force microscopy, confocal microscopy, and scanning electrochemical microscopy
【期刊】:Canadian Journal of Chemistry-Revue Canadienne De Chimie
【年、卷、期、起止页码】: 2007, 85(3): 175-183
【全文链接】:http://www.ingentaconnect.com/content/nrc/cjc/2007/00000085/00000003/art00003
或者https://article.pubs.nrc-cnrc.gc.ca/RPAS/rpv?hm=HInit&calyLang=eng&journal=cjc&volume=85&afpf=v07-007.pdf&sepr=vt
【序号】:4
【作者】:Edwards, M. A., S. Martin, et al.
【题名】:Scanning electrochemical microscopy: principles and applications to biophysical systems
【期刊】:Physiological Measuremen
【年、卷、期、起止页码】: 2006, 27(12): R63-R108
【全文链接】:http://iopscience.iop.org/0967-3334/27/12/R01/pdf/0967-3334_27_12_R01.pdf
【序号】:5
【作者】:Davoodi, A., A. Farzadi, et al.
【题名】:Developing an AFM-Based SECM system; Instrumental setup, SECM simulation, characterization, and calibration
【期刊】:Journal of the Electrochemical Society
【年、卷、期、起止页码】: 2008, 155(8): C474-C485
【全文链接】:http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=JESOAN00015500000800C474000001&idtype=cvips&gifs=yes&ref=no
新增加第5篇,谢谢。
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补充答案:
灰米奇回复于2011/02/13
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