From your xrd results, the sample seems to be ploycrystal not single crystal. So why don't you take the SAED photo(from low mag BF)? I have two more questions and one suggestion. 1. How did you calculate the interplanar d spacing for each plane? 2. Why there is no scale bar in the ED pattern or any information about your operation conditions? If you know these informations, then you can calculated d values by camera constant method. 3. It is dangerous to index the pattern just by inspection with similar patterns. Good luck
首先非常感谢你的建议。1. How did you calculate the interplanar d spacing for each plane?我是用卡尺直接在底片上量的。 2. Why there is no scale bar in the ED pattern or any information about your operation conditions? If you know these informations, then you can calculated d values by camera constant method.衍射底片本来就没有标尺呀，只是用特定型号的电镜就有固定的相机常数。我们用的是2010，200Kv,所以 相机常数（Lλ）中λ=0.00251nm。 另外我想请教一下：通过XRD如何来判断是单晶还是多晶.非常感谢！
Generally speaking, if your samples are ploycrystal, there will be all diffracted peaks allowed by the structure factors of that material. If the sample is single crystal, the peaks will not be shown like those of JCPDS card. There are only some planes can be observed along the orientation of the crystalline. Say, the common planes alone C orientation are (00L)s.
我的社区
签到
赛默飞实验室产品焕新计划有奖调研！
【七月征文】不一YOUNG实验“猿”
报名开启：ICS2024第十三届光谱网络会议！
推荐收藏！盘点中药材及饮片检测解决方案
